Obtain Pricing on Huntron Inc Part Number MODEL-2000 with the NSN 6625-01-287-3379

Part Number: MODEL-2000

Alternate P/N: MODEL2000

Manufacturer: Huntron Inc

NSN: 6625-01-287-3379

NIIN: 012873379

Item Name : Test Set Electronic

CAGE Code: 57705

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country : USA

NCB Code : 01

Welcome to our online Request for Quote (RFQ) service, where you can fill out and submit the form provided below to obtain tailored procurement options from our team of industry experts. You have taken interest in part number MODEL-2000, which is a Test Set Electronic item from Huntron Inc that is listed with the NSN 6625-01-287-3379 for quick identification. Should you wish to move forward with quotation for this listing, be sure that you supply us with key details like your target pricing, quality, and delivery date. This information is what we will base presented quotes on, with responses offered shortly after the receipt and review of each form.

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To ensure that customers only procure exact items of need, we present our offerings with as much relevant data as possible. For example, part number MODEL-2000 was specifically produced by Huntron Inc under the CAGE Code 57705, providing traceability. Furthermore, with the NSN 6625-01-287-3379, one can also determine that this listing falls under Federal Supply Class (FSC) 6625 Electrical and Electronic Properties Measuring and Testing Instruments. Alongside such details, all purchases will come delivered with any applicable qualifying certifications, furthering the reliability of our purchasing options. With this in mind, be sure to request a quote on part number MODEL-2000, and we will be in touch.

Characteristics Data of NSN 6625-01-287-3379, 6625012873379

MRC	Criteria	Characteristic
TEXT	GENERAL CHARACTERISTICS ITEM DESCRIPTION	FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT
ZZZW	DEPARTURE FROM CITED DOCUMENT	PEACETIME DEMAND OBTAIN
CXCY	III PART NAME ASSIGNED BY CONTROLLING AGENCY	TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER